{"id":366,"date":"2024-03-21T12:53:09","date_gmt":"2024-03-21T03:53:09","guid":{"rendered":"https:\/\/www.eiiris.tut.ac.jp\/en\/?p=366"},"modified":"2024-05-15T13:18:48","modified_gmt":"2024-05-15T04:18:48","slug":"240315-16visit","status":"publish","type":"post","link":"https:\/\/www.eiiris.tut.ac.jp\/en\/research-activities\/news\/240315-16visit\/","title":{"rendered":"Campus tour participants visited the LSI fab"},"content":{"rendered":"<div>\u3000On March 15 and 16, 2024, a delegation of students participating in the campus tour visited the LSI fab of the Institute for Integrated Circuits and Devices.<br \/>Associate Professor Toshihiko Noda, Professor Yasuhiko Ishikawa, and Associate Professor Young-Jun Choi of the Department of Electrical, Electronics, and Computer Engineering, gave a tour of the semiconductor integrated circuit facilities and equipment at the LSI fab.<br \/>\u3000\u3000After the tour, we received comments from the participants, such as &#8220;It was a valuable experience for me to visit such a wonderful facility,&#8221; and &#8220;Although it was a very difficult subject, I was very interested in it because we were allowed to take a closer look at the facilities and had detailed explanations.<\/div>\r\n<div><br \/><span>\u00a0<\/span><span><br \/><\/span><\/div>\r\n<div><img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.eiiris.tut.ac.jp\/wp-content\/uploads\/2024\/03\/240315image1-scaled.jpg\" alt=\"\" width=\"427\" height=\"286\" class=\"alignnone size-large wp-image-4777\" \/>\u00a0 <img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.eiiris.tut.ac.jp\/wp-content\/uploads\/2024\/03\/240315image2-scaled.jpg\" alt=\"\" width=\"427\" height=\"286\" class=\"alignnone size-large wp-image-4778\" \/><br \/>\u3000<\/div>\r\n<div>\u00a0<\/div>\r\n<div><\/div>\r\n<p>*<a href=\"https:\/\/www.eiiris.tut.ac.jp\/blog\/research-activities\/news\/240315-16visit\/\" target=\"_blank\" rel=\"noopener noreferrer\">\u30ad\u30e3\u30f3\u30d1\u30b9\u30c4\u30a2\u30fc\u53c2\u52a0\u8005 \u4e00\u884c\u304cLSI\u5de5\u5834\u3092\u898b\u5b66\u3055\u308c\u307e\u3057\u305f | IRES\u00b2 \u6b21\u4e16\u4ee3\u534a\u5c0e\u4f53\u30fb\u30bb\u30f3\u30b5\u79d1\u5b66\u7814\u7a76\u6240 \u8c4a\u6a4b\u6280\u8853\u79d1\u5b66\u5927\u5b66 (tut.ac.jp)<\/a><\/p>\r\n<div><\/div>","protected":false},"excerpt":{"rendered":"\u3000On March 15 and 16, 2024, a delegation of students participating in the campus tour visited the LSI fab of th [&hellip;]","protected":false},"author":4,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[1],"class_list":["post-366","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/posts\/366","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/comments?post=366"}],"version-history":[{"count":3,"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/posts\/366\/revisions"}],"predecessor-version":[{"id":453,"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/posts\/366\/revisions\/453"}],"wp:attachment":[{"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/media?parent=366"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.eiiris.tut.ac.jp\/en\/wp-json\/wp\/v2\/categories?post=366"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}