{"id":9,"date":"2026-01-15T11:29:03","date_gmt":"2026-01-15T02:29:03","guid":{"rendered":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/?page_id=9"},"modified":"2026-01-15T11:29:03","modified_gmt":"2026-01-15T02:29:03","slug":"support","status":"publish","type":"page","link":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/support\/","title":{"rendered":"Support"},"content":{"rendered":"<div class=\"box02 my-5\">\n<ul class=\"anchorlink d-md-flex flex-wrap mb-0\">\n\t<li class=\"me-md-5\"><a href=\"#detail\">Our Services<\/a><\/li>\n\t<li class=\"me-md-5\"><a href=\"#mode\">Support Menu<\/a><\/li>\n\t<li class=\"me-md-5\"><a href=\"#report\">Result Reporting<\/a><\/li>\n<\/ul>\n<\/div>\n<h2 id=\"detail\">Our Services<\/h2>\n<h3>\ud83d\udca1 Design<\/h3>\n<ul class=\"list\">\n\t<li>Design for integrating CMOS integrated circuits with high value-added functions (sensors, photonics, etc.)<\/li>\n\t<li>Design and analysis of impurity profiles and operating potentials (TCAD, Spectra)<\/li>\n<\/ul>\n<h3>\ud83d\udd2c Fabrication and Prototyping<\/h3>\n<ul class=\"list\">\n\t<li>Integrated Circuit (Up to 4-inch wafers; supports gate lengths of 1.5 \u03bcm and 5 \u03bcm)\n<ul class=\"list-s\">\n\t<li>CMOS Integrated Circuits<\/li>\n\t<li>Mixed CMOS\/JFET Integrated Circuits<\/li>\n\t<li>Devices integrating ICs with MEMS, sensors, and functional materials<\/li>\n\t<li>Potential-detection multimodal sensor arrays (light, ion, pressure, etc.)<\/li>\n<\/ul>\n<\/li>\n\t<li>Device\n<ul class=\"list-s\">\n\t<li>GaN and GaN\/Si devices (Micro-LEDs, Micro-LED arrays)<\/li>\n\t<li>Optical devices using compound semiconductors (LEDs, solar cells)<\/li>\n\t<li>Optical waveguides (Si, SiGe processing)<\/li>\n\t<li>MEMS, microfluidic channels, and \u03bcTAS devices<\/li>\n<\/ul>\n<\/li>\n\t<li>Packaging (Wafer dicing, bonding)<\/li>\n<\/ul>\n<h3>\ud83c\udf93 Education Programs<\/h3>\n<ul class=\"list\">\n\t<li>Integrated Circuit Technology Course for professionals and students (covering everything from n-MOS IC processing to evaluation: 5-day course)<\/li>\n<li>Workshop on Co-Creation and nurturing for Advanced Semiconductor Engineer with a Broad Perspective \u2013 CMOS LSI Full Process Course \u2013 (A nine-day practical course focused on manufacturing an image sensor using the Planar CMOS process)<\/li>\n<\/ul>\n<h3>\ud83e\uddea Evaluation<\/h3>\n<ul class=\"list\">\n\t<li>Wafer Process Evaluation (Thin film thickness measurement, step height measurement, CD measurement, observation)<\/li>\n\t<li>Electrical Characteristic Measurement and Evaluation (MOSFETs, CMOS Integrated Circuits) <\/li>\n<\/ul>\n<h2 id=\"mode\">Support Menu<\/h2>\n<table class=\"res\">\n<thead>\n<tr>\n<th style=\"width: 20%\">Menu<\/th>\n<th>Description<\/th>\n<\/tr>\n<\/thead>\n<tbody>\n<tr>\n<th>\u2460 Technical Consultation<\/th>\n<td>Staff provide consultation to help solve technical problems.<\/td>\n<\/tr>\n<tr>\n<th>\u2461 Equipment Usage<\/th>\n<td>Users with operational skills operate the equipment themselves to conduct experiments.<\/td>\n<\/tr>\n<tr>\n<th>\u2462 Technical Assistance<\/th>\n<td>Users operate the equipment under the guidance and assistance of staff.<\/td>\n<\/tr>\n<tr>\n<th>\u2463 Technical Service<\/th>\n<td>Staff perform technical work (operation) on behalf of the user based on their request.<\/td>\n<\/tr>\n<tr>\n<th>\u2464 Joint Research<\/th>\n<td>Users and university researchers conduct research jointly and publish results.<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<h2 id=\"report\">Result Reporting<\/h2>\n\n<div class=\"button01\"><a href=\"https:\/\/nanonet.go.jp\/page\/dir000011.html\" target=\"_blank\" rel=\"noopener\">Advanced Research Infrastructure for Materials and Nanotechnology in Japan (ARIM)<\/a><\/div>","protected":false},"excerpt":{"rendered":"Our Services Support Menu Result Reporting Our Services \ud83d\udca1 Design Design for integrating CMOS integrated circui [&hellip;]","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-9","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/wp-json\/wp\/v2\/pages\/9","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/wp-json\/wp\/v2\/comments?post=9"}],"version-history":[{"count":0,"href":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/wp-json\/wp\/v2\/pages\/9\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.eiiris.tut.ac.jp\/arim-en\/wp-json\/wp\/v2\/media?parent=9"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}